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Nanocomposite approaches toward pellicles for 157-nm lithography

Published in:
J. Microlith., Microfab., Microsyst., Vol. 4, No. 1, January-March 2005, pp. 013004-1 - 013004-6.

Summary

Pellicle materials for use at 157 nm must display sufficient transparency at this wavelength and adequate lifetimes to be useful. We blended a leading candidate fluoropolymer with silica nanoparticles to examine the effect on both the transparency and lifetime of the pellicle. It is anticipated that these composite materials may increase the lifetime by perhaps quenching reactive species and/or by dilution, without severely decreasing the 157-nm transmission. Particles surface-modified with fluorinated moieties are also investigated. The additives are introduced as stable nanoparticle dispersions to casting solutions of the fluoropolymers. The properties of these solutions, films, and the radiationinduced darkening rates are reported. The latter are reduced in proportion to the dilution of the polymer, but there is no evidence that the nanoparticles act as radical scavengers.
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Summary

Pellicle materials for use at 157 nm must display sufficient transparency at this wavelength and adequate lifetimes to be useful. We blended a leading candidate fluoropolymer with silica nanoparticles to examine the effect on both the transparency and lifetime of the pellicle. It is anticipated that these composite materials may...

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Marathon evaluation of optical materials for 157-nm lithography

Published in:
J. Microlithogr., Microfab., Microsyst., Vol. 2, No. 1, January 2003, pp. 19-26.

Summary

We present the methodology and recent results on the longterm evaluation of optical materials for 157-nm lithographic applications. We review the unique metrology capabilities that have been developed for accurately assessing optical properties of samples both online and offline, utilizing VUV spectrophotometry with in situlamp-based cleaning. We describe ultraclean marathon testing chambers that have been designed to decouple effects of intrinsic material degradation from extrinsic ambient effects. We review our experience with lithography-grade 157-nm lasers and detector durability. We review the current status of bulk materials for lenses, such as CaF(2) and BaF(2), and durability results of antireflectance coatings. Finally, we discuss the current state of laser durability of organic pellicles.
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Summary

We present the methodology and recent results on the longterm evaluation of optical materials for 157-nm lithographic applications. We review the unique metrology capabilities that have been developed for accurately assessing optical properties of samples both online and offline, utilizing VUV spectrophotometry with in situlamp-based cleaning. We describe ultraclean marathon...

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