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The TESS camera: modeling and measurements with deep depletion devices

Summary

The Transiting Exoplanet Survey Satellite, a NASA Explorer-class mission in development, will discover planets around nearby stars, most notably Earth-like planets with potential for follow up characterization. The all-sky survey requires a suite of four wide field-of-view cameras with sensitivity across a broad spectrum. Deep depletion CCDs with a silicon layer of 100 um thickness serve as the camera detectors, providing enhanced performance in the red wavelengths for sensitivity to cooler stars. The performance of the camera is critical for the mission objectives, with both the optical system and the CCD detectors contributing to the realized image quality. Expectations for image quality are studied using a combination of optical ray tracing in Zemax and simulations in Matlab to account for the interaction of the incoming photons with the 100 um silicon layer. The simulations include a probabilistic model to determine the depth of travel in the silicon before the photons are converted to photo-electrons, and a Monte Carlo approach to charge diffusion. The charge diffusion model varies with the remaining depth for the photo-electron to traverse and the strength of the intermediate electric field. The simulations are compared with laboratory measurements acquired by an engineering unit camera with the TESS optical design and deep depletion CCDs. In this paper we describe the performance simulations and the corresponding measurements taken with the engineering unit camera, and discuss where the models agree well in predicted trends and where there are differences compared to observations.
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Summary

The Transiting Exoplanet Survey Satellite, a NASA Explorer-class mission in development, will discover planets around nearby stars, most notably Earth-like planets with potential for follow up characterization. The all-sky survey requires a suite of four wide field-of-view cameras with sensitivity across a broad spectrum. Deep depletion CCDs with a silicon...

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Back-illuminated three-dimensionally integrated CMOS image sensors for scientific applications

Published in:
SPIE Vol. 6690, Focal Plane Arrays for Space Telescopes III, 27-28 August 2007, 669009.

Summary

SOI-based active pixel image sensors have been built in both monolithic and vertically interconnected pixel technologies. The latter easily supports the inclusion of more complex pixel circuitry without compromising pixel fill factor. A wafer-scale back-illumination process is used to achieve 100% fill factor photodiodes. Results from 256 x 256 and 1024 x 1024 pixel arrays are presented, with discussion of dark current improvement in the differing technologies.
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Summary

SOI-based active pixel image sensors have been built in both monolithic and vertically interconnected pixel technologies. The latter easily supports the inclusion of more complex pixel circuitry without compromising pixel fill factor. A wafer-scale back-illumination process is used to achieve 100% fill factor photodiodes. Results from 256 x 256 and...

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Soft-x-ray CCD imagers for AXAF

Published in:
IEEE Trans. Electron Devices, Vol. 44, No. 10, October 1997, pp. 1633-1642.

Summary

We describe the key features and performance data of a 1024 x 1026-pixel frame-transfer imager for use as a soft-x-ray detector on the NASA X-ray observatory Advanced X-ray Astrophysics Facility (AXAF). The four-port device features a floating-diffusion output circuit with a responsivity of 20/spl mu/V/e/sup -/ and noise of about 2 e/sup -/ at a 100-kHz data rate. Techniques for achieving the low sense-node capacitance of 5 fF are described. The CCD is fabricated on high-resistivity p-type silicon for deep depletion and includes narrow potential troughs for transfer inefficiencies of around 10/sup -7/ (ten to the negative 7). To achieve good sensitivity at energies below 1 keV, we have developed a back-illumination process that features low recombination losses at the back surface and has produced efficiencies of about 0.7 at 277 eV (carbon K/spl alpha/).
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Summary

We describe the key features and performance data of a 1024 x 1026-pixel frame-transfer imager for use as a soft-x-ray detector on the NASA X-ray observatory Advanced X-ray Astrophysics Facility (AXAF). The four-port device features a floating-diffusion output circuit with a responsivity of 20/spl mu/V/e/sup -/ and noise of about...

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