Peter W. Wyatt

Dr. Peter W. Wyatt is a senior technical staff member in the Quantum Information and Integrated Nanosystems Group, where he designs structures, tests, and analytical techniques to characterize and improve the CMOS fabrication process in Lincoln Laboratory's Microelectronics Laboratory. He uses those results both to generate the SPICE parameters needed by circuit designers and to guide troubleshooting efforts as fabrication problems arise.

Prior to joining the Laboratory, Wyatt worked at Bell Laboratories, where he studied the behavior of tantalum thin-film capacitors used in the hybrid integrated circuits that were key components of telephone systems in the years before the dominance of digital silicon. In previous years at Lincoln Laboratory, he worked on metal-nitride-oxide-semiconductor (MNOS) memory, wafer-scale integrated circuits, nitridation of silicon dioxide, graphene devices, and microelectromechanical switch reliability, serving as an assistant and then associate group leader. For six years, he was on the Steering Committee of the IEEE International Conference on Wafer-Scale Integration and was program chair in 1992 and general chair in 1993.

Wyatt holds a BS degree in electrical engineering from the California Institute of Technology and a PhD degree in engineering and applied science from Yale University.